Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction1
نویسندگان
چکیده
This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The Al x In1-x Sb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental coplanar three-beam or coincidental noncoplanar four-beam X-ray diffraction. These conditions provide the means for a high-precision determination of lattice parameters and strain anisotropy in layers.
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عنوان ژورنال:
دوره 50 شماره
صفحات -
تاریخ انتشار 2017